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Surface and Thin Film Characterization
- Products
- Technology
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Applications
- Local Influence on Optical Properties and Thickness of ITO-Films by Means of Plasma Flow
- Microstructured lipid bilayers
- Graphene and Graphene Oxide
- Technology ellipsometry with the example graphene
- Dispersion Functions Manual
- Functional Coatings on Cantilevers
- Laser Diodes
- EP³ SPR
- Characterization of an anisotropic film
- Effective medium approach for nanoparticles in colloidal and photonic crystals
- Mapping of a thick transparent layer
- Microcontact Printed Monolayers inspected with Imaging Ellipsometry and Scanning Probe Microscopy
- Thickness measurement of SiO2 layer on Si-wafer.
- Micropatterned Polymer Films
- Characterization of glass micro array
- Kinetic Binding Studies using OptiSlides
- Characterisation of bulk-heterojunction layers for solar cell application
- Real-time monitoring of polyelectrolyte-multilayer growth onto tantalum pentoxide (Ta2O5) by internal reflection ellipsometry
- Publications
- References
- FAQ's
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Active Vibration Isolation
- Products
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Applications
- Scanning Probe Microscope - SPM
- Interferometer
- Ellipsometer
- Brewster Angle Microscope
- Reflection Spectrometer
- Langmuir-Blodgett trough
- Tensiometer
- Profilometer
- Nanoindenter
- Raman Spectroskope
- Patch clamping
- Electron Microscopes
- Confocal Microscopes
- Inverted Microscope
- Fluorescence Microscopes
- Two Photon Microscope
- Holographic Microscope
- Other Microscopes
- Technology
- FAQ's
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