Product overview Imaging Ellipsometer

Imaging Ellipsometry overcomes the limits of classical ellipsometers by determing film thickness and optical properties by combining nulling ellipsometry with microscopy. You receive ellipsometric high contrast images from the surface with highest lateral resolution down to 1µm. Spectroscopic ellipsometry enables you studying complex materials like polymer surfaces, graphene, monolayer, biosensors, proteins, colloids and many more.

Imaging single wave ellipsometer nanofilm_ep3sw

nanofilm_ep3sw

Single Wavelength Imaging Ellipsometry for investigation of structured ultra thin films
Imaging spectroscopic ellipsometer nanofilm_ep3se

nanofilm_ep3se

Spectroscopic Imaging Ellipsometry for investigation of complex structured ultra thin films
Brewster angle microscope nanofilm_ep3bam - please have in mind, that the trough in the image is not part of the instrument.-

nanofilm_bam

Brewster Angle Microscopy for investigation of organic ultra-thin films
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nanofilm accessories

A large range of accessories to fit the systems to your specific applications
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nanofilm_refspec

Reflection spectroscopy on the air-water interface
Imaging surface plasmon resonance reader - with the capability of an imaging ellipsometer: nanofilm_ep3spr

application package SPR

Multi– Channel and Imaging Surface Plasmon Resonance Analyser
SPM + imaging ellipsometer = nanofilm_ep3spem

application package AFM

atomic force microscopy combined with Imaging Ellipsometry
Imaging surface plasmon resonance reader - with the capability of an imaging ellipsometer: nanofilm_ep3spr

application package Liquid/gas Solution

in situ imaging ellipsometry at the solid/liquid interface
Ellipsometry is a well-known non-destructive optical method for determing film thickness and optical properties like refrective index by measuring delta and psi. Imaging Ellipsometry combines the power of ellipsometry with microscopy and overcomes the limits of classical ellipsometers.

The Nanofilm Imaging Ellipsometers enable you to study the surface in three steps:

  • generating high contrast image from the surface
  • ellipsometry with highest lateral resolution (1µm)
  • generating of 3D thickness maps

Single Wavelength and Spectroscopic Imaging Ellipsometers are very versatile and can be used for many different applications:
polymer surfaces, graphene, monolayer, Langmuir Blodgett films, biosensors, membranes, proteins, colloids, plastic solar cells, organic sensors, functional surfaces (like data storage OLED’s, LED’s, LC), MEMS, biochips, microcontact printing, semiconductor, photoresist layers, lipid bilayer, functional coatings on cantilever, … and many more.
You will find further application samples under www.accurion.com/Applications_Nanofilm

You want to learn more about your structured surfaces? - You need to use an imaging Ellipsometer!

You want to have special features or solutions, please feel free to ask our development team!
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